VisualSentry
Zero-shot industrial anomaly detection system that learns exclusively from defect-free images and localizes unseen defects at inference time — no defect labels required. Fuses DINOv2-powered PatchCore memory retrieval with CLIP-based WinCLIP semantic scoring, achieving 0.9545 average image AUROC across four MVTec AD categories with sub-50ms ONNX inference.